Unique and practical IC timing analysis tool utilizing intrinsic photon emission

Microelectronics Reliability

Volumn 41, Issue 9-10, 2001, Pages 1507-1512

  Goldblatt, Norman ^a   Leibowitz, Martin ^a   Lo, William ^a  

^a SCHLUMBERGER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; GRAPHICAL USER INTERFACES; IMAGING TECHNIQUES; JITTER; NOISE ABATEMENT; PHOTONS; SIGNAL PROCESSING;

PHOTON EMISSION; TIMING ANALYSIS TOOL;

CHIP SCALE PACKAGES;

EID: 0035456920     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(01)00154-8     Document Type: Article

References (5)

1. JA Kash, JC-H Tsang, "Noninvasive Optical Method for Measuring Internal Switching and other Dynamic Parameters of CMOS Circuits", US Patent #5,940,545, issued 17 August 1999.
2. S. Kasapi, C-C Tsao, K. Wilsher, W. Lo, S. Somani, Micro. Rel. 39 (1999) 957.
3. th ISTFA (2000) 479.
4. J. A. Kash, J. C. Tsang, Phys. Stat. Sol. (b) 204 (1997) 507.
5. S Somani, S Kasapi, K Wilsher, W Lo, R Sobolewski, G Goltsman, to be published in JVST B Nov/Dec 2001.