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Volumn 766, Issue , 2003, Pages 385-390

AFM studies of deformation and interfacial sliding in interconnect structures in microelectronic devices

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; DEFORMATION; DIELECTRIC MATERIALS; INTERFACES (MATERIALS); THERMAL CYCLING; THERMAL EXPANSION; THERMODYNAMIC STABILITY;

EID: 0348199012     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-766-e4.11     Document Type: Conference Paper
Times cited : (3)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.