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Volumn 766, Issue , 2003, Pages 385-390
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AFM studies of deformation and interfacial sliding in interconnect structures in microelectronic devices
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COMPUTER SIMULATION;
DEFORMATION;
DIELECTRIC MATERIALS;
INTERFACES (MATERIALS);
THERMAL CYCLING;
THERMAL EXPANSION;
THERMODYNAMIC STABILITY;
INTERCONNECT STRUCTURE;
INTERFACIAL SLIDING;
SHEAR LAG BASED MODEL;
THERMAL EXCURSIONS;
MICROELECTRONICS;
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EID: 0348199012
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-766-e4.11 Document Type: Conference Paper |
Times cited : (3)
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References (15)
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