Temperature dependence of the electrical and electromechanical properties of lead zirconate titanate thin films

Applied Physics Letters

Volumn 83, Issue 21, 2003, Pages 4396-4398

  Maiwa, Hiroshi ^a   Kim, Seung Hyun ^b   Ichinose, Noboru ^c  

^a SHONAN INSTITUTE OF TECHNOLOGY   (Japan)

^b INOSTEK Inc   (South Korea)

^c WASEDA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; DIELECTRIC PROPERTIES; ELECTRIC PROPERTIES; FERROELECTRICITY; FILM PREPARATION; MECHANICAL PROPERTIES; PERMITTIVITY MEASUREMENT; PROBES; SPUTTER DEPOSITION; STRAIN RATE; THERMAL EFFECTS; THIN FILMS;

CHEMICAL SOLUTION DEPOSITION; CURIE TEMPERATURE; DEVONSHIRE CLASSICAL THEORY; ELECTROMECHANICAL PROPERTIES; LEAD ZIRCONATE TITANATE; SCANNING PROBE MICROSCOPY; TEMPERATURE DEPENDENCE;

SEMICONDUCTING LEAD COMPOUNDS;

EID: 0348107228     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1629786     Document Type: Article

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