|
Volumn 17, Issue 2-4, 2000, Pages 299-304
|
Three-dimensional Monte Carlo simulations of electromigration in polycrystalline thin films
|
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 0347874105
PISSN: 09270256
EISSN: None
Source Type: Journal
DOI: 10.1016/s0927-0256(00)00041-0 Document Type: Article |
Times cited : (26)
|
References (15)
|