Numerical solution of the electromigration boundary value problem under pulsed dc conditions

Journal of Applied Physics

Volumn 80, Issue 9, 1996, Pages 4948-4951

  Gui, Xiang ^a,b   Dew, Steven K ^a   Brett, Michael J ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

^b UNIVERSITY OF CALGARY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002637463     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363538     Document Type: Article

References (21)

1. J. R. Black, IEEE Trans. Electron Devices ED-16, 338 (1969).
2. J. M. Towner and E. P. van de Ven, in Proceedings of the 21st International Reliability Physics Symposium (IEEE, New York, 1983), p. 36.
3. L. Brooke, in Proceedings of the 25th International Reliability Physics Symposium (IEEE, New York, 1987), p. 136.
4. B. K. Liew, N. W. Cheung, and C. Hu, in Proceedings of the 27th International Reliability Physics Symposium (IEEE, New York, 1989), p. 215.
5. J. A. Maiz, in Proceedings of the 27th International Reliability Physics Symposium (IEEE, New York, 1989), p. 220.
6. J. S. Suehle and H. A. Schafft, in Proceedings of the 27th International Reliability Physics Symposium (IEEE, New York, 1989), p. 229.
7. D. G. Pierce, E. S. Snyder, S. E. Swanson, and L. W. Irwin, in Proceedings of the 32nd International Reliability Physics Symposium (IEEE, New York, 1994), p. 198.
8. M. Shatzkes and J. R. Lloyd, J. Appl. Phys. 59, 3890 (1986).
9. J. J. Clement and J. R. Lloyd, J. Appl. Phys. 71, 1729 (1992).
10. J. R. Lloyd, J. Appl. Phys. 69, 7601 (1991).
11. J. J. Clement, J. Appl. Phys. 71, 4264 (1992).
12. J. R. Lloyd and J. Kitchin, J. Mater. Res. 9, 563 (1994).
13. V. M. Dwyer, F.-S. Wang, and P. Donaldson, J. Appl. Phys. 76, 7305 (1994).
14. I. A. Blech, J. Appl. Phys. 47, 1203 (1976).
15. S. R. de Groot, Physica 9, 699 (1942).
16. P. B. Johns, Int. J. Numer. Method Eng. 11, 1307 (1977).
17. X. Gui, D. de Cogan, S. K. Dew, and M. J. Brett, Int. J. Numer. Model. Electron. Netw. Devices Fields (to be published).
18. X. Gui, P. W. Webb, and G. B. Gao, IEEE Trans. Electron Devices ED-39, 1295 (1992).
19. X. Gui, S. K. Dew, M. J. Brett, and D. de Cogan, J. Appl. Phys. 74, 7173 (1993).
20. M. Y. Al-Zeben, A. H. M. Saleh, and M. A. Al-Omar, Int. J. Numer. Model. Electron. Netw. Devices Fields 5, 219 (1992).
21. R. A. Sigsbee, J. Appl. Phys. 44, 2533 (1973).