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Volumn 37, Issue 1, 1997, Pages 77-85
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Temperature coefficient of resistance fluctuations during electromigration in Al lines
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM;
ELECTRIC CONDUCTIVITY;
ELECTRIC RESISTANCE;
GRAIN BOUNDARIES;
INTEGRATED CIRCUITS;
MATHEMATICAL MODELS;
THERMAL EFFECTS;
ALUMINUM STRIPES;
TEMPERATURE COEFFICIENT OF RESISTANCE (TCR);
ELECTROMIGRATION;
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EID: 0030784353
PISSN: 00262714
EISSN: None
Source Type: Journal
DOI: 10.1016/0026-2714(96)00240-5 Document Type: Article |
Times cited : (7)
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References (9)
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