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Volumn 340-342, Issue , 2003, Pages 165-170

Stacking faults in silicon carbide

Author keywords

Dislocations; Quantum well; Solid solid phase transition; Stacking fault

Indexed keywords

CRYSTAL GROWTH; DISLOCATIONS (CRYSTALS); ENERGY GAP; HAMILTONIANS; PHASE TRANSITIONS; PROBABILITY DENSITY FUNCTION; SEMICONDUCTOR DIODES; SEMICONDUCTOR QUANTUM WELLS; STACKING FAULTS; THERMODYNAMIC PROPERTIES;

EID: 0347764791     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2003.09.045     Document Type: Conference Paper
Times cited : (79)

References (26)
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    • H. Iwata, Ph.D. Thesis no. 817, Linköping University, 2003.
    • (2003)
    • Iwata, H.1
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    • 0242378635 scopus 로고    scopus 로고
    • Iwata H., Lindefelt U., Öberg S., Briddon P.R. Mater. Sci. Forum. 433-436:2002;519 Iwata H., Lindefelt U., Öberg S., Briddon P.R. Microelectronics J. 34:2003;371 H. Iwata, U. Lindefelt, S. Öberg, P.R. Briddon, Phys. Rev. B, submitted.
    • (2002) Mater. Sci. Forum , vol.433-436 , pp. 519
    • Iwata, H.1    Lindefelt, U.2    Öberg, S.3    Briddon, P.R.4
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    • 0037505408 scopus 로고    scopus 로고
    • Iwata H., Lindefelt U., Öberg S., Briddon P.R. Mater. Sci. Forum. 433-436:2002;519 Iwata H., Lindefelt U., Öberg S., Briddon P.R. Microelectronics J. 34:2003;371 H. Iwata, U. Lindefelt, S. Öberg, P.R. Briddon, Phys. Rev. B, submitted.
    • (2003) Microelectronics J. , vol.34 , pp. 371
    • Iwata, H.1    Lindefelt, U.2    Öberg, S.3    Briddon, P.R.4
  • 21
    • 26544478371 scopus 로고    scopus 로고
    • submitted
    • Iwata H., Lindefelt U., Öberg S., Briddon P.R. Mater. Sci. Forum. 433-436:2002;519 Iwata H., Lindefelt U., Öberg S., Briddon P.R. Microelectronics J. 34:2003;371 H. Iwata, U. Lindefelt, S. Öberg, P.R. Briddon, Phys. Rev. B, submitted.
    • Phys. Rev. B
    • Iwata, H.1    Lindefelt, U.2    Öberg, S.3    Briddon, P.R.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.