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Volumn 340-342, Issue , 2003, Pages 734-737
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Photoluminescence study of self-interstitial clusters and extended defects in ion-implanted silicon
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Author keywords
Defects; Interstitial cluster; Photoluminescence; Silicon
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Indexed keywords
ANNEALING;
CRYSTAL DEFECTS;
HIGH ENERGY PHYSICS;
HIGH TEMPERATURE EFFECTS;
ION IMPLANTATION;
MOLECULAR ORIENTATION;
RADIATION DAMAGE;
SILICON;
SILICON WAFERS;
INTERSTITIAL CLUSTERS;
PRECURSORS;
PHOTOLUMINESCENCE;
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EID: 0347764766
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physb.2003.09.107 Document Type: Conference Paper |
Times cited : (7)
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References (9)
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