-
1
-
-
0002089822
-
-
Atwood, J. L.; Davies, J. E., MacNicol, D. D., Eds.; Acidemic Press: London
-
(a) MacNicol, D. D.; McKendrick, J. J.; Wilson, D. R. In Inclusion Compounds; Atwood, J. L.; Davies, J. E., MacNicol, D. D., Eds.; Acidemic Press: London, 1984; Vol. 2.
-
(1984)
Inclusion Compounds
, vol.2
-
-
MacNicol, D.D.1
McKendrick, J.J.2
Wilson, D.R.3
-
2
-
-
12044251859
-
-
(b) Simard, M.; Su, D.; Wuest, J. D. J. Am. Chem. Soc. 1991, 113, 4696.
-
(1991)
J. Am. Chem. Soc.
, vol.113
, pp. 4696
-
-
Simard, M.1
Su, D.2
Wuest, J.D.3
-
4
-
-
0031036251
-
-
(d) Endo, K.; Ezuhara, T.; Koyonagi, M.; Hideki, M.; Aoyama, Y.; J. Am. Chem. Soc. 1997, 119, 499.
-
(1997)
J. Am. Chem. Soc.
, vol.119
, pp. 499
-
-
Endo, K.1
Ezuhara, T.2
Koyonagi, M.3
Hideki, M.4
Aoyama, Y.5
-
5
-
-
0033620407
-
-
Kuzmenko, K.; Kjaer, K.; Als-Nielsen, J.; Lahav, M.; Leiserowitz, L. J. Am. Chem. Soc. 1999, 121, 2657.
-
(1999)
J. Am. Chem. Soc.
, vol.121
, pp. 2657
-
-
Kuzmenko, K.1
Kjaer, K.2
Als-Nielsen, J.3
Lahav, M.4
Leiserowitz, L.5
-
6
-
-
0000508568
-
-
Gidalevitz, D.; Weissbuch, I.; Kjaer, K.; Als-Nielsen, J.; Leiserowitz, L. J. Am. Chem. Soc. 1994, 116, 3271.
-
(1994)
J. Am. Chem. Soc.
, vol.116
, pp. 3271
-
-
Gidalevitz, D.1
Weissbuch, I.2
Kjaer, K.3
Als-Nielsen, J.4
Leiserowitz, L.5
-
7
-
-
0040585392
-
-
Burgi, H.-B.; Hulliger, J.; Langley, P. J. Curr. Opin. Sol. State Mater. Sci. 1998, 3, 425.
-
(1998)
Curr. Opin. Sol. State Mater. Sci.
, vol.3
, pp. 425
-
-
Burgi, H.-B.1
Hulliger, J.2
Langley, P.J.3
-
9
-
-
5344226866
-
-
Bohanon, T. M.; Denziger, S.; Fink, R.; Paulus, W.; Ringsdorf, H.; Weck, M. Angew. Chem. Int. Ed. Engl. 1995, 34, 58.
-
(1995)
Angew. Chem. Int. Ed. Engl.
, vol.34
, pp. 58
-
-
Bohanon, T.M.1
Denziger, S.2
Fink, R.3
Paulus, W.4
Ringsdorf, H.5
Weck, M.6
-
11
-
-
0029860636
-
-
(b) Cha, X.; Ariga, K.; Kunitake, T. J. Am. Chem. Soc. 1996, 118, 9545.
-
(1996)
J. Am. Chem. Soc.
, vol.118
, pp. 9545
-
-
Cha, X.1
Ariga, K.2
Kunitake, T.3
-
12
-
-
0001195035
-
-
(c) Sasaki, D. Y.; Kurihara, K.; Kunitake, T. J. Am. Chem. Soc. 1992, 114, 10994.
-
(1992)
J. Am. Chem. Soc.
, vol.114
, pp. 10994
-
-
Sasaki, D.Y.1
Kurihara, K.2
Kunitake, T.3
-
13
-
-
0034434642
-
-
Siegel, S.; Kindermann, M.; Regenbrecht, M.; Vollhardt, D.; von Kiedrowski, G. Prog. Colloid Polym. Sci. 2000, 115, 233.
-
(2000)
Prog. Colloid Polym. Sci.
, vol.115
, pp. 233
-
-
Siegel, S.1
Kindermann, M.2
Regenbrecht, M.3
Vollhardt, D.4
Von Kiedrowski, G.5
-
14
-
-
0034616486
-
-
Plaut, D. J.; Lund, K. M.; Ward, M. D. Chem. Commun. 2000, 9, 769.
-
(2000)
Chem. Commun.
, vol.9
, pp. 769
-
-
Plaut, D.J.1
Lund, K.M.2
Ward, M.D.3
-
15
-
-
0000615457
-
-
Tyson, J. C.; Moore, J. L.; Hughes, K. D.; Collard, D. M. Langmuir 1997, 13, 2068.
-
(1997)
Langmuir
, vol.13
, pp. 2068
-
-
Tyson, J.C.1
Moore, J.L.2
Hughes, K.D.3
Collard, D.M.4
-
16
-
-
0034838174
-
-
Kuzmenko, I.; Kindermann, M.; Kjaer, K.; Howes, P. B.; Als-Nielsen, J.; Granek, R.; von Kiedrowski, G.; Leiserowitz, L.; Lahav, M. J. Am. Chem. Soc. 2001, 123. 3771.
-
(2001)
J. Am. Chem. Soc.
, vol.123
, pp. 3771
-
-
Kuzmenko, I.1
Kindermann, M.2
Kjaer, K.3
Howes, P.B.4
Als-Nielsen, J.5
Granek, R.6
Von Kiedrowski, G.7
Leiserowitz, L.8
Lahav, M.9
-
17
-
-
0035354582
-
-
Kuzmenko, I.; Rapaport, H.; Kjaer, K.; Als-Nielsen, J.; Weissbuch, I.; Lahav, M.; Leiserowitz, L. Chem. Rev. 2001, 101, 1659.
-
(2001)
Chem. Rev.
, vol.101
, pp. 1659
-
-
Kuzmenko, I.1
Rapaport, H.2
Kjaer, K.3
Als-Nielsen, J.4
Weissbuch, I.5
Lahav, M.6
Leiserowitz, L.7
-
18
-
-
0035904439
-
-
Alonso, C.; Eliash, R.; Jensen, T. R.; Kjaer, K.; Lahav, M.; Leiserowitz. L. J. Am. Chem. Soc. 2001, 123, 10105.
-
(2001)
J. Am. Chem. Soc.
, vol.123
, pp. 10105
-
-
Alonso, C.1
Eliash, R.2
Jensen, T.R.3
Kjaer, K.4
Lahav, M.5
Leiserowitz, L.6
-
19
-
-
0033760768
-
-
Ashwell, G. J.; Dyer, A. N.; Green, A.; Sato, N.; Sakuma, T. J. Mater. Chem. 2000, 10, 2473.
-
(2000)
J. Mater. Chem.
, vol.10
, pp. 2473
-
-
Ashwell, G.J.1
Dyer, A.N.2
Green, A.3
Sato, N.4
Sakuma, T.5
-
20
-
-
0035856067
-
-
Alonso, C.; Kuzmenko, I.; Jensen, T. R.; Kjaer, K.; Lahav, M.; Leiserowitz, L. J. Phys. Chem. B 2001, 105, 8563.
-
(2001)
J. Phys. Chem. B
, vol.105
, pp. 8563
-
-
Alonso, C.1
Kuzmenko, I.2
Jensen, T.R.3
Kjaer, K.4
Lahav, M.5
Leiserowitz, L.6
-
21
-
-
0030466107
-
-
Kuzmenko, I.; Buller, R.; Bouman, W. G.; Kjaer, K.; Als-Nielsen, J.; Lahav, M.; Leiserovitz, L. Science 1996, 274, 2046.
-
(1996)
Science
, vol.274
, pp. 2046
-
-
Kuzmenko, I.1
Buller, R.2
Bouman, W.G.3
Kjaer, K.4
Als-Nielsen, J.5
Lahav, M.6
Leiserovitz, L.7
-
22
-
-
0028768956
-
-
Russell, V. A.; Etter, M. C.; Ward, M. D. J. Am. Chem. Soc. 1994, 116, 1941.
-
(1994)
J. Am. Chem. Soc.
, vol.116
, pp. 1941
-
-
Russell, V.A.1
Etter, M.C.2
Ward, M.D.3
-
23
-
-
0031780159
-
-
Swift, J. A.; Pivovar, A. M.; Reynolds, A. M. J. Am. Chem. Soc. 1998, 24, 5887.
-
(1998)
J. Am. Chem. Soc.
, vol.24
, pp. 5887
-
-
Swift, J.A.1
Pivovar, A.M.2
Reynolds, A.M.3
-
24
-
-
0033585541
-
-
Evans, C. C.; Sukarto, L.; Ward, M. D. J. Am. Chem. Soc. 1999, 121, 320.
-
(1999)
J. Am. Chem. Soc.
, vol.121
, pp. 320
-
-
Evans, C.C.1
Sukarto, L.2
Ward, M.D.3
-
25
-
-
0035976581
-
-
Holman, K. T.; Pivovar, A. M.; Ward, M. D. Science 2001, 294, 1907
-
(2001)
Science
, vol.294
, pp. 1907
-
-
Holman, K.T.1
Pivovar, A.M.2
Ward, M.D.3
-
26
-
-
1842378076
-
-
Russell, V. A.; Evans, C. C.; Li, W.; Ward, M. D. Science 1997, 276, 575.
-
(1997)
Science
, vol.276
, pp. 575
-
-
Russell, V.A.1
Evans, C.C.2
Li, W.3
Ward, M.D.4
-
27
-
-
0035104464
-
-
Holman, K. T.; Pivovar, A. M.; Swift, J. A.; Ward, M. D. Acc. Chem. Res. 2001, 34, 107.
-
(2001)
Acc. Chem. Res.
, vol.34
, pp. 107
-
-
Holman, K.T.1
Pivovar, A.M.2
Swift, J.A.3
Ward, M.D.4
-
28
-
-
0034595387
-
-
Holman, K. T.; Ward, M. D. Angew. Chem., Int. Ed. 2000, 39, 1653.
-
(2000)
Angew. Chem., Int. Ed.
, vol.39
, pp. 1653
-
-
Holman, K.T.1
Ward, M.D.2
-
29
-
-
0034814486
-
-
Holman, K. T.; Martin, S. M.; Parker, D. P.; Ward, M. D. J. Am. Chem. Soc. 2002, 123, 4421.
-
(2002)
J. Am. Chem. Soc.
, vol.123
, pp. 4421
-
-
Holman, K.T.1
Martin, S.M.2
Parker, D.P.3
Ward, M.D.4
-
30
-
-
0348168111
-
-
note
-
3, temperature 173(2) K; Z = 8: R1(I > 2σ(1)) = 0.0580; wR2(I > 2σ(1)) = 0.1899; GOF = 1.096.
-
-
-
-
31
-
-
0346277340
-
-
note
-
3, temperature 173(2) K; Z = 4; R1(I > 2σ(1)) = 0.0594: wR2(I > 2σ(1)) = 0.1420; GOF = 1.032.
-
-
-
-
34
-
-
0032493249
-
-
Kuzmenko, I.; Kaganer, V. M.; Leiserowitz, L. Langmuir 1998, 14, 3882.
-
(1998)
Langmuir
, vol.14
, pp. 3882
-
-
Kuzmenko, I.1
Kaganer, V.M.2
Leiserowitz, L.3
-
35
-
-
1842312126
-
X-ray 2D-Powder Diffraction Methods for Films at Liquid Surfaces
-
Lindgård, P.-A., Bechgaard, K., Clausen, K. N., Feidenhans'l, R., Johannsen, I., Eds.; RISØ-R-779(EN); Risø National Laboratory; Roskilde, Denmark; Jan
-
Kjaer, K.; Bouwman, W. G. X-ray 2D-Powder Diffraction Methods for Films at Liquid Surfaces. In Annual Progress Report of the Department of Solid State Physics 1 January-31 December 1994; Lindgård, P.-A., Bechgaard, K., Clausen, K. N., Feidenhans'l, R., Johannsen, I., Eds.; RISØ-R-779(EN); Risø National Laboratory; Roskilde, Denmark; Jan 1995; p 79.
-
(1995)
Annual Progress Report of the Department of Solid State Physics 1 January-31 December 1994
, pp. 79
-
-
Kjaer, K.1
Bouwman, W.G.2
-
36
-
-
0348168105
-
X-ray Diffraction from Curved Thin Films
-
Jørgensen, M., Bechgaard, K., Clausen, K. N., Feidenhans'l, R., Johannsen, I., Eds.; RISØ-R-933(EN); Risø National Laboratory; Roskilde, Denmark; Jan
-
Howes, P. B., Kjaer, K. X-ray Diffraction from Curved Thin Films. Annual Progress Report of the Department of Solid State Physics 1 January-31 December 1996; Jørgensen, M., Bechgaard, K., Clausen, K. N., Feidenhans'l, R., Johannsen, I., Eds.; RISØ-R-933(EN); Risø National Laboratory; Roskilde, Denmark; Jan 1997; p 71.
-
(1997)
Annual Progress Report of the Department of Solid State Physics 1 January-31 December 1996
, pp. 71
-
-
Howes, P.B.1
Kjaer, K.2
-
37
-
-
0346277342
-
-
note
-
3, temperature 100(1) K; Z = 4: R1 (I > 2σ(1)) = 0.1527; wR2-(I > 2σ(1)) = 0.3604; GOF = 1.071.
-
-
-
-
38
-
-
0029386798
-
-
Weinbach, S. P.; Weissbuch, I.; Kjaer, K.; Bouwman, W. G.; Nielsen, J. A.; Lahav, M.; Leiserowitz, L. Adv. Mater. 1995, 7, 857.
-
(1995)
Adv. Mater.
, vol.7
, pp. 857
-
-
Weinbach, S.P.1
Weissbuch, I.2
Kjaer, K.3
Bouwman, W.G.4
Nielsen, J.A.5
Lahav, M.6
Leiserowitz, L.7
-
39
-
-
0347538367
-
-
note
-
3, temperature 173(2) K; Z = 4; R1(I > 2σ(1)) = 0.1110; wR2(I > 2σ(1)) = 0.2138: GOF = 1.095.
-
-
-
-
40
-
-
0035813923
-
-
Horner, M. J.; Holman, K. T.; Ward, M. D. Angew. Chem., Int. Ed. 2001, 40, 4045.
-
(2001)
Angew. Chem., Int. Ed.
, vol.40
, pp. 4045
-
-
Horner, M.J.1
Holman, K.T.2
Ward, M.D.3
-
41
-
-
77957063705
-
Structural Properties and Interactions of Thin Films at the Air-Liquid Interface Explored by Synchrotron X-ray Scattering
-
Moebius, D., Miller, R., Eds.; Studies in Interface Science 11: Elsevier Science: Amsterdam
-
Jensen, T. R.; Kjaer, K. Structural Properties and Interactions of Thin Films at the Air-Liquid Interface Explored by Synchrotron X-ray Scattering. In Novel Methods to Study Interfacial Layers; Moebius, D., Miller, R., Eds.; Studies in Interface Science 11: Elsevier Science: Amsterdam, 2001; pp 205-254.
-
(2001)
Novel Methods to Study Interfacial Layers
, pp. 205-254
-
-
Jensen, T.R.1
Kjaer, K.2
-
42
-
-
0347538369
-
-
note
-
2 (IRIX platform) and Materials Studio (Windows platform) computational packages, Accelrys, San Diego, CA.
-
-
-
-
44
-
-
0034681538
-
-
Weissbuch, I.; Baxter, P. N. W.; Kuzmenko, I.; Cohen, H.; Cohen, S.; Kjaer, K.; Howes, P. B.; Als-Nielsen, J.; Lehn, J. M.; Leiserowitz, L.; Lahav, M. Chem. Eur. J. 2000, 6, 725.
-
(2000)
Chem. Eur. J.
, vol.6
, pp. 725
-
-
Weissbuch, I.1
Baxter, P.N.W.2
Kuzmenko, I.3
Cohen, H.4
Cohen, S.5
Kjaer, K.6
Howes, P.B.7
Als-Nielsen, J.8
Lehn, J.M.9
Leiserowitz, L.10
Lahav, M.11
-
45
-
-
0034763332
-
-
Rapaport, H. Kuzmenko, I.; Lafont, S. Kjaer, K.; Howes, P. B.; Als-Nielsen, J.; Lahav, M.; Leiserowitz, L. Biophys. J. 2001, 81, 2729.
-
(2001)
Biophys. J.
, vol.81
, pp. 2729
-
-
Rapaport, H.1
Kuzmenko, I.2
Lafont, S.3
Kjaer, K.4
Howes, P.B.5
Als-Nielsen, J.6
Lahav, M.7
Leiserowitz, L.8
-
47
-
-
0003937971
-
-
Bruker Analytical X-Ray Systems, Madison, WI
-
SAINT V6.1, Bruker Analytical X-Ray Systems, Madison, WI.
-
SAINT V6.1
-
-
-
48
-
-
0347538365
-
-
SIR-97: Altomare, A.; Burla, M. C.; Camalli, M.; Cascarano, G.; Giacovazzo, C.; Guagliardi, A.; Moliterni, A. G. G.; Polidori, G.; Spagna, R. (1997).
-
(1997)
SIR-97
-
-
Altomare, A.1
Burla, M.C.2
Camalli, M.3
Cascarano, G.4
Giacovazzo, C.5
Guagliardi, A.6
Moliterni, A.G.G.7
Polidori, G.8
Spagna, R.9
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