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33845280219
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(a) See, for example: (a) Ermer, O. J. Am. Chem. Soc. 1988, 110, 3747-3754. (b) Simard, M.; Su, D.; Wuest, J. D. Ibid. 1991, 113, 4696-4698. (c) Copp, S. B.; Subramanian, S.; Zaworotko, M. J. Ibid. 1992, 114, 8719-8720. (d) Reddy, D. S.; Craig, D. C.; Rae, A. D.; Desiraju, G. R. J. Chem. Soc., Chem. Commun. 1993, 1737-1739. (e) Zaworotko, M. J. Chem. Soc. Rev. 1994, 23, 283-288. (f) Batten, S. R.; Hoskins, B. F.; Robson, R. J. Am. Chem. Soc. 1995, 117, 5385-5386. (g) Fujita, M.; Kwon, Y. J.; Sasaki, O.; Yamaguchi, K.; Ogura, K. Ibid. 1995, 117, 7287-7288.
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Ermer, O.1
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4
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(a) See, for example: (a) Ermer, O. J. Am. Chem. Soc. 1988, 110, 3747-3754. (b) Simard, M.; Su, D.; Wuest, J. D. Ibid. 1991, 113, 4696-4698. (c) Copp, S. B.; Subramanian, S.; Zaworotko, M. J. Ibid. 1992, 114, 8719-8720. (d) Reddy, D. S.; Craig, D. C.; Rae, A. D.; Desiraju, G. R. J. Chem. Soc., Chem. Commun. 1993, 1737-1739. (e) Zaworotko, M. J. Chem. Soc. Rev. 1994, 23, 283-288. (f) Batten, S. R.; Hoskins, B. F.; Robson, R. J. Am. Chem. Soc. 1995, 117, 5385-5386. (g) Fujita, M.; Kwon, Y. J.; Sasaki, O.; Yamaguchi, K.; Ogura, K. Ibid. 1995, 117, 7287-7288.
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0001434508
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(a) See, for example: (a) Ermer, O. J. Am. Chem. Soc. 1988, 110, 3747-3754. (b) Simard, M.; Su, D.; Wuest, J. D. Ibid. 1991, 113, 4696-4698. (c) Copp, S. B.; Subramanian, S.; Zaworotko, M. J. Ibid. 1992, 114, 8719-8720. (d) Reddy, D. S.; Craig, D. C.; Rae, A. D.; Desiraju, G. R. J. Chem. Soc., Chem. Commun. 1993, 1737-1739. (e) Zaworotko, M. J. Chem. Soc. Rev. 1994, 23, 283-288. (f) Batten, S. R.; Hoskins, B. F.; Robson, R. J. Am. Chem. Soc. 1995, 117, 5385-5386. (g) Fujita, M.; Kwon, Y. J.; Sasaki, O.; Yamaguchi, K.; Ogura, K. Ibid. 1995, 117, 7287-7288.
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(a) See, for example: (a) Ermer, O. J. Am. Chem. Soc. 1988, 110, 3747-3754. (b) Simard, M.; Su, D.; Wuest, J. D. Ibid. 1991, 113, 4696-4698. (c) Copp, S. B.; Subramanian, S.; Zaworotko, M. J. Ibid. 1992, 114, 8719-8720. (d) Reddy, D. S.; Craig, D. C.; Rae, A. D.; Desiraju, G. R. J. Chem. Soc., Chem. Commun. 1993, 1737-1739. (e) Zaworotko, M. J. Chem. Soc. Rev. 1994, 23, 283-288. (f) Batten, S. R.; Hoskins, B. F.; Robson, R. J. Am. Chem. Soc. 1995, 117, 5385-5386. (g) Fujita, M.; Kwon, Y. J.; Sasaki, O.; Yamaguchi, K.; Ogura, K. Ibid. 1995, 117, 7287-7288.
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Reddy, D.S.1
Craig, D.C.2
Rae, A.D.3
Desiraju, G.R.4
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0000318814
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(a) See, for example: (a) Ermer, O. J. Am. Chem. Soc. 1988, 110, 3747-3754. (b) Simard, M.; Su, D.; Wuest, J. D. Ibid. 1991, 113, 4696-4698. (c) Copp, S. B.; Subramanian, S.; Zaworotko, M. J. Ibid. 1992, 114, 8719-8720. (d) Reddy, D. S.; Craig, D. C.; Rae, A. D.; Desiraju, G. R. J. Chem. Soc., Chem. Commun. 1993, 1737-1739. (e) Zaworotko, M. J. Chem. Soc. Rev. 1994, 23, 283-288. (f) Batten, S. R.; Hoskins, B. F.; Robson, R. J. Am. Chem. Soc. 1995, 117, 5385-5386. (g) Fujita, M.; Kwon, Y. J.; Sasaki, O.; Yamaguchi, K.; Ogura, K. Ibid. 1995, 117, 7287-7288.
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Zaworotko, M.J.1
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(a) See, for example: (a) Ermer, O. J. Am. Chem. Soc. 1988, 110, 3747-3754. (b) Simard, M.; Su, D.; Wuest, J. D. Ibid. 1991, 113, 4696-4698. (c) Copp, S. B.; Subramanian, S.; Zaworotko, M. J. Ibid. 1992, 114, 8719-8720. (d) Reddy, D. S.; Craig, D. C.; Rae, A. D.; Desiraju, G. R. J. Chem. Soc., Chem. Commun. 1993, 1737-1739. (e) Zaworotko, M. J. Chem. Soc. Rev. 1994, 23, 283-288. (f) Batten, S. R.; Hoskins, B. F.; Robson, R. J. Am. Chem. Soc. 1995, 117, 5385-5386. (g) Fujita, M.; Kwon, Y. J.; Sasaki, O.; Yamaguchi, K.; Ogura, K. Ibid. 1995, 117, 7287-7288.
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Batten, S.R.1
Hoskins, B.F.2
Robson, R.3
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(a) See, for example: (a) Ermer, O. J. Am. Chem. Soc. 1988, 110, 3747-3754. (b) Simard, M.; Su, D.; Wuest, J. D. Ibid. 1991, 113, 4696-4698. (c) Copp, S. B.; Subramanian, S.; Zaworotko, M. J. Ibid. 1992, 114, 8719-8720. (d) Reddy, D. S.; Craig, D. C.; Rae, A. D.; Desiraju, G. R. J. Chem. Soc., Chem. Commun. 1993, 1737-1739. (e) Zaworotko, M. J. Chem. Soc. Rev. 1994, 23, 283-288. (f) Batten, S. R.; Hoskins, B. F.; Robson, R. J. Am. Chem. Soc. 1995, 117, 5385-5386. (g) Fujita, M.; Kwon, Y. J.; Sasaki, O.; Yamaguchi, K.; Ogura, K. Ibid. 1995, 117, 7287-7288.
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Fujita, M.1
Kwon, Y.J.2
Sasaki, O.3
Yamaguchi, K.4
Ogura, K.5
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Hashimoto, H.8
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For a general reference on electronic spectroscopy of organic crystals, see: Pope, M.; Swenberg, C. E. Annu. Rev. Phys. Chem. 1984, 35, 613-655.
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Pope, M.1
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14
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1842341050
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note
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Fluorescence maxima (nm) for other pattern-m adducts and solid anthracene are 420, 442, 465 (sh), and 500 (sh) (for 1·3a). 414, 438, 460, and 490 (sh) (1·9b), 414, 437, 460, and 490 (sh) (1·9g). and 422, 444, 470, 493 (sh) (solid anthracene) (sh = shoulder).
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17
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1842277757
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note
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3, Z = 2, d = 1.225, no. of uniq rflc = 7671, no. of rflc used = 2512, GOF = 1.18, R = 0.040.
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18
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1842275848
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note
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Apohost 1 dispersed in KBr shows a featureless emission at 446 nm when irradiated at 408 nm.
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19
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0001114875
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footnote 16
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(15) The choice of low temperatures is to minimize dissolution of the host and its adducts. Nevertheless, exchange may involve dissolution and recrystallization; the mechanism of guest-exchange under the solid-liquid conditions has not been established. For related work, see: (a) Wang, X.; Simard, M.; Wuest, J. D. J. Am. Chem. Soc. 1994, 116, 12119-12120 (footnote 16). (b) Reference 4b (footnote 20).
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(1994)
J. Am. Chem. Soc.
, vol.116
, pp. 12119-12120
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Wang, X.1
Simard, M.2
Wuest, J.D.3
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20
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0001114875
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Reference 4b (footnote 20)
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The choice of low temperatures is to minimize dissolution of the host and its adducts. Nevertheless, exchange may involve dissolution and recrystallization; the mechanism of guest-exchange under the solid-liquid conditions has not been established. For related work, see: (a) Wang, X.; Simard, M.; Wuest, J. D. J. Am. Chem. Soc. 1994, 116, 12119-12120 (footnote 16). (b) Reference 4b (footnote 20).
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