Novel depth profiling in CdS-CdTe thin films

Thin Solid Films

Volumn 361, Issue , 2000, Pages 234-238

  Rogers, K D ^a   Wood, D A ^a   Painter, J D ^a   Lane, D W ^a   Ozsan, M E ^b  

^a CRANFIELD UNIVERSITY   (United Kingdom)

^b U 12 Brooklands Close S   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CADMIUM SULFIDE SOLAR CELLS; ELECTRODEPOSITION; ETCHING; HETEROJUNCTIONS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING CADMIUM TELLURIDE; STOICHIOMETRY; TEXTURES; THERMAL EFFECTS; THIN FILM DEVICES; X RAY DIFFRACTION ANALYSIS;

DEPTH PROFILING; ION BEAM ANALYSIS;

SEMICONDUCTING FILMS;

EID: 0033882137     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00840-8     Document Type: Article

References (6)

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3. Rogers K.D., Painter J.D., Healy M.J., Lane D.W., Ozsan M.E. Thin Solid Films. 339:1999;299.
4. Barker J., Binns S., Johnson D., et al. Int. J. Solar Energy. 12:1992;79.
5. Doolittle L.R. Nucl. Instrum. Methods. B. 64:1992;134.
6. Wood D., Rogers K.D., Lane D.W., Conibeer G., Parton D. J. Mater. Sci. Lett. 17:1998;1511.