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Volumn 30, Issue 1, 2000, Pages 20-31

Direct Bonding of (111) and (100) Oriented Silicon Wafers

Author keywords

Bond tensile strength; Bonding; Crystal orientation dependent bonding; Direct bonding; MEMS; MicroElectroMechanical Systems; MicroMachining; MM; Semiconductors; Silicon wafers; Surface roughness; Voids

Indexed keywords


EID: 0347069027     PISSN: 03529045     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (4)

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