Cauliflower Hillock Formation through Crystallite Migration of SnO 2 Thin Films Prepared on Alumina Substrates by Using MOCVD

Journal of the Korean Physical Society

Volumn 43, Issue 6, 2003, Pages

  Choi, Gwangpyb ^a   Ryu, Hyunwook ^a   Seo, Yongjin ^b   Lee, Woosun ^a   Hong, Kwangjun ^a   Shin, Dongcharn ^a   Park, Jinseong ^a   Akbar, Sheikh A ^c  

^a Chosun University   (South Korea)

^b Daebul University   (South Korea)

^c Ctr for Indust Sensors/Msrmt   (United States)

Author keywords

Crystallite migration; Hillock formation; MOCVD thin film; Tin dioxide

Indexed keywords

EID: 0347021199     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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