Microstructure and optical properties of submicron porous silicon thin films grown at low current densities

Journal of Applied Physics

Volumn 87, Issue 5, 2000, Pages 2169-2177

  Riley, David W ^a   Gerhardt, Rosario A ^a  

^a Georgia Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346985902     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372157     Document Type: Article

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