Measurement of dielectric absorption of capacitors and analysis of its effects on VCO's

IEEE Transactions on Instrumentation and Measurement

Volumn 45, Issue 1, 1996, Pages 89-97

  Kuenen, Jeroen C ^a   Meijer, Gerard C M ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC RELAXATION; ELECTRIC VARIABLES MEASUREMENT; FREQUENCY DOMAIN ANALYSIS; POLYCARBONATES; PRINTED CIRCUIT BOARDS; TIME DOMAIN ANALYSIS; VARIABLE FREQUENCY OSCILLATORS;

DIELECTRIC ABSORPTION;

CAPACITORS;

EID: 0030080754     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.481317     Document Type: Article

References (8)

1. J. W. Fattaruso, M. de Wit, G. Warwar, K. S. Tan and R. K. Hester, "The effect of dielectric relaxation on charge-redistribution A/D converters," IEEE J. Solid-State Circuits, vol. 25, no. 6, pp. 1550-51, Dec. 1990.
2. P. C. Dow, "An analysis of certain errors in electronic differential analyzers," IRE Trans. Electr. Comp., pp. 17-22, Mar. 1958.
3. W. G. Jung and R. Marsh, "Picking capacitors," Audio, 8 pages. Mar. 1980.
4. J. E. Buchanan, "Recovery voltage measurements with emphasis below one second for class 1 NPO ceramic capacitors," IEEE Trans. Comp., Hybrids, Manufact. Technol., vol. CHMT-1, no. 1, pp. 112-114, Mar. 1978.
5. Manual, Low Level Measurements, Keithley Instruments, Inc., Cleveland, OH 1984.
6. R. A. Pease, "Understand capacitor soakage to optimize analog systems," EDN, pp. 125-129, 1990, Oct. 13.
7. K. Hyyppä, "Dielectric absorption in memory capacitors," IEEE Trans. Instrum. Meas., vol. 21, no. 1, pp. 53-56, Feb. 1972.
8. J. C. Kuenen, "Diëlectrische absorptie van condensatoren en de gevolgen hiervan in relaxatie oscillatoren," M.Sc. Thesis (in Dutch), Afstudeerverslag 1991-7, Delft University of Technology, Delft, The Netherlands, 1991.