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Review of Scientific Instruments

Volumn 74, Issue 12, 2003, Pages 5105-5110

Scanning vector Hall probe microscope

(6) Fedor, J a Cambel, V a Gregusova D a Hanzelka, P b Derer J a Volko, J a

a INSTITUTE OF ELECTRICAL ENGINEERING (Slovakia)

b INSTITUTE OF SCIENTIFIC INSTRUMENTS (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

CRYOGENICS; CRYOSTATS; ELECTRON MOBILITY; IMAGING TECHNIQUES; MAGNETIC FIELDS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTICAL SENSORS; PERSONAL COMPUTERS; PROBES; PRODUCT DESIGN; SCANNING; SEMICONDUCTING GALLIUM ARSENIDE; STAINLESS STEEL; SUPERCONDUCTING MATERIALS; TEMPERATURE CONTROL; VECTORS;

MAGNETIC FORCE MICROSCOPY (MFM); SPATIAL RESOLUTION; VECTOR HALL PROBE MICROSCOPE (VHPM);

MICROSCOPES;

EID: 0346936160 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.1623004 Document Type: Article

Times cited : (5)

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