Scanning probe microscopy of high-temperature superconductors

Superconductor Science and Technology

Volumn 12, Issue 4, 1999, Pages

  De Lozanne, Alex ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; HALL EFFECT; MAGNETOOPTICAL EFFECTS; MICROWAVES; SCANNING TUNNELING MICROSCOPY; SENSORS; SQUIDS;

MAGNETIC FORCE MICROSCOPY (MFM); SCANNING PROBE MICROSCOPY;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0032665809     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/12/4/001     Document Type: Article

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