Facet formation and characterization of III-V structures grown on patterned surfaces

Microelectronics Journal

Volumn 28, Issue 8-10, 1997, Pages 803-815

  Heinecke, H ^a   Wachter, M ^a   Schoffel U ^a  

^a UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346790375     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0026-2692(96)00119-x     Document Type: Article

References (20)

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