Field emission from diamond particles studied by scanning field emission microscopy

Ultramicroscopy

Volumn 95, Issue SUPPL., 2003, Pages 145-151

  Watanabe, Akihiko ^a   Deguchi, Masahiro ^b   Kitabatake, Makoto ^a   Kono, Shozo ^c  

^a OSAKA UNIVERSITY   (Japan)

^b PANASONIC CORPORATION   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

Field emission; Microparticle; Morphology; Scanning tunneling microscopy

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ELECTRODES; ELECTRONS; FIELD EMISSION MICROSCOPES; SUBSTRATES; VACUUM;

FIELD EMISSION PROPERTIES;

DIAMOND DEPOSITS;

DIAMOND; METAL;

ARTICLE; DISPERSION; ELECTRIC CONDUCTIVITY; ELECTRIC FIELD; ELECTRICITY; ELECTRODE; ELECTRON; ELECTRON TRANSPORT; FIELD EMISSION; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; MEASUREMENT; MODEL; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPY; SURFACE PROPERTY; VACUUM; VAPOR;

EID: 0346665567     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00311-X     Document Type: Article

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