Scanning tunnelling microscopy: application to field electron emission studies

Journal of Physics D: Applied Physics

Volumn 32, Issue 7, 1999, Pages 815-819

  Frolov, V D ^a   Karabutov, A V ^a   Konov, V I ^a   Pimenov, S M ^a   Prokhorov, A M ^a  

^a PROKHOROV GENERAL PHYSICS INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

DIAMOND FILMS; ELECTRIC CONDUCTIVITY; ELECTRON EMISSION; PHASE TRANSITIONS; PHYSICAL PROPERTIES; SURFACE PROPERTIES; SURFACE TOPOGRAPHY;

EMISSION INTENSITY; SCANNING TUNNELING FIELD EMISSION MICROSCOPE; SURFACE POTENTIAL DISTRIBUTION;

SCANNING TUNNELING MICROSCOPY;

EID: 0033531578     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/32/7/010     Document Type: Article

References (9)

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