Potential of a wavelength sampling approach for profilometry by phase shifting interferometry

Journal of Modern Optics

Volumn 46, Issue 2, 1999, Pages 327-339

  Sandoz, Patrick ^a   Calatroni, Jose ^b   Tribillon, Gilbert ^a  

^a UNIVERSITÉ DE FRANCHE COMTÉ   (France)

^b UNIVERSIDAD SIMÓN BOLÍVAR   (Venezuela)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346548386     PISSN: 09500340     EISSN: 13623044     Source Type: Journal    
DOI: 10.1080/09500349908231274     Document Type: Article

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