Characterization of thermally annealed tunnel junctions with preoxidized CoFe pinned electrode

Journal of Applied Physics

Volumn 94, Issue 12, 2003, Pages 7778-7783

  Lee, J H ^a   Im, D H ^a   Yoon, C S ^a   Kim, C K ^a   Ando, Y ^b   Kubota, H ^b   Miyazaki, T ^b  

^a Hanyang University   (South Korea)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; AUGER ELECTRON SPECTROSCOPY; COBALT COMPOUNDS; ELECTRODES; ELECTRON TRANSPORT PROPERTIES; INTERFACES (MATERIALS); MAGNETORESISTANCE; OXIDATION; POLARIZATION; X RAY PHOTOELECTRON SPECTROSCOPY;

MAGNETIC TUNNEL JUNCTIONS; THERMAL ANNEALING;

TUNNEL JUNCTIONS;

EID: 0346305072     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1628827     Document Type: Article

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