Threshold Al KLL auger spectra of oxidized aluminium foils

Surface and Interface Analysis

Volumn 35, Issue 11, 2003, Pages 922-931

  Buckley, A N ^a   Hartmann, A J ^a   Lamb, R N ^a   Stampfl, A P J ^b   Freeland, J W ^c   Coulthard, I ^d  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b Bragg Institute   (Australia)

^c ARGONNE NATIONAL LABORATORY   (United States)

^d CANADIAN LIGHT SOURCE INC   (Canada)

Author keywords

Al K edge XANES; O K edge XANES; Oxidized aluminium; Threshold Al KLL; XPS

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CHARACTERIZATION; HYDROXYLATION; PHOTOELECTRON SPECTROSCOPY; SURFACE CHEMISTRY; SURFACE PROPERTIES; X RAY SPECTROSCOPY;

K EDGE X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; SURFACE AREA; THICKNESS;

ALUMINUM FOIL;

EID: 0345330207     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1626     Document Type: Article

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