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Surface and Interface Analysis

Volumn 34, Issue 1, 2002, Pages 485-489

Quantification of oxide film thickness at the surface of aluminium using XPS

(5) Alexander, M R a Thompson, G E a Zhou, X a Beamson, G b Fairley, N c

a UNIVERSITY OF MANCHESTER (United Kingdom)

b CLRC (United Kingdom)

c Casa Software Ltd (United Kingdom)

Author keywords

Al 2p; Aluminium; Anodic; Oxide; Thickness; XPS

Indexed keywords

CURVE FITTING; FILM GROWTH; HYDRATION; OXIDES; SURFACE STRUCTURE; THICKNESS MEASUREMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

BEER-LAMBERT TREATMENT; HYDROXIDE; OXIDE FILM THICKNESS;

ALUMINUM;

EID: 0036692797 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1344 Document Type: Conference Paper

Times cited : (163)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.