The validity of C1s charge referencing in the XPS of oxidised Al-Si alloys

Applied Surface Science

Volumn 103, Issue 4, 1996, Pages 403-407

  Werrett, C R ^a   Bhattacharya, A K ^a   Pyke, D R ^b  

^a UNIVERSITY OF WARWICK   (United Kingdom)

^b AKZO NOBEL CENTRAL RESEARCH   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ALLOYS; BINDING ENERGY; CATALYTIC CRACKING; GROWTH (MATERIALS); HYDROCARBONS; OXIDATION; OXIDES; SEGREGATION (METALLOGRAPHY); SPECTROSCOPIC ANALYSIS; SURFACES; X RAY PHOTOELECTRON SPECTROSCOPY;

ALUMINUM SILICIDES; CHARGE REFERENCING; OXIDE GROWTH;

SURFACE PHENOMENA;

EID: 0030383075     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)00539-9     Document Type: Article

References (12)

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2. M.P. Seah, in: Practical Surface Analysis, 2nd ed., Vol. 1, Eds. D. Briggs and M.P. Seah (Wiley, Chichester, 1990) p. 541.
3. P. Swift, Surf. Interf. Anal. 4 (1982) 47.
4. R.G. Pritchard and C.R. Werrett, Surf. Interf. Anal. 23 (1995) 705.
5. To be published.
6. L.D. Landau and E.M. Lifshitz, Quantum Mechanics (Pergamon, Oxford, 1958).
7. I. Olefjord, H.J. Mathieu and P. Marcus, Surf. Interf. Anal. 15 (1990) 681.
8. A. Nylund and I. Olefjord, Surf. Interf. Anal. 21 (1994) 283.
9. C.D. Wagner, NIST Standard Reference Database 20, NIST X-ray Photoelectron Spectroscopy Database, Version 1 (U.S. Department of Commerce, Gaithersburg, MD, 1989).
10. In press.
11. Private communication.
12. Private communication.