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Volumn 362, Issue 1-2, 2004, Pages 241-247

Rietveld refinement for CuInSe2 and CuIn3Se 5

Author keywords

Crystal growth; Crystal structure and symmetry; Semiconductors; X ray diffraction

Indexed keywords

COMPOSITION; CRYSTAL GROWTH; CRYSTAL LATTICES; MIXTURES; POLYCRYSTALS; SEMICONDUCTOR MATERIALS; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

EID: 0344983458     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(03)00592-9     Document Type: Conference Paper
Times cited : (57)

References (33)
  • 32
    • 0344132363 scopus 로고    scopus 로고
    • transl. from
    • Orlova N.S., Bodnar' L.V., Kushner T.L. Inorg. Mater. 38:2002;3. [transl. from: Izv. Akad. Nauk SSSR: Neorg. Mater. 28 (2002) 7].
    • (2002) Izv. Akad. Nauk SSSR: Neorg. Mater. , vol.28 , pp. 7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.