Preparation, structure, and thermal expansion of CuIn3Se 5

Inorganic Materials

Volumn 38, Issue 1, 2002, Pages 3-7

  Orlova, N S ^a   Bodnar, I V ^b   Kushner, T L ^c  

^a INSTITUTE OF SOLID STATE AND SEMICONDUCTOR PHYSICS   (Belarus)

^b BELARUSIAN STATE UNIVERSITY OF INFORMATICS AND RADIOELECTRONICS   (Belarus)

^c BREST STATE TECHNICAL UNIVERSITY   (Belarus)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER COMPLEX;

ANALYTIC METHOD; ARTICLE; CHEMICAL PROCEDURES; CHEMICAL STRUCTURE; CRYSTAL STRUCTURE; MOLECULAR SIZE; SOLID; STRUCTURE ANALYSIS; TEMPERATURE DEPENDENCE; X RAY DIFFRACTION;

EID: 0344563899     PISSN: 00201685     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1013682923319     Document Type: Article

References (21)

1. 2, J. Appl. Phys., 1993, vol. 73, no. 6, pp. 2902-2909.
2. Boehnke, U.-C. and Kuhn, G., Phase Relation in the Ternary System Cu-In-Se, J. Mater. Sci., 1987, vol. 22, no. 9, pp. 1635-1641.
3. Honle, W., Kuhn, G., and Boehnke, U.-C., Crystal Structure of Two Quenched Cu-In-Se Phases, Cryst. Res. Technol., 1988, vol. 23, no. 10/11, pp. 1347-1354.
4. 5 Thin Films, Jpn. J. Appl. Phys., 1994, vol. 33, no. 9A, pp. L1251-L1253.
5. 5 Films, J. Appl. Phys., 1994, vol. 76, no. 3, pp. 1503-1510.
6. 5, Inst. Phys. Conf. Ser., Sect. D, 1997, no. 152, pp. 573-577.
7. 5 by Horizontal Bridgman Method, J. Cryst. Growth, 1999, vol. 200, no. 1, pp. 137-142.
8. 8 Compounds, Thin Solid Films, 2000, vol. 361/362, no. 1, pp. 70-73.
9. 2, J. Appl. Crystallogr., 1973, vol. 6, no. 3, pp. 414-417.
10. 2 Using the Simulation of the X-ray Diffraction, Cryst. Res. Technol., 1996, vol. 31, suppl., pp. 813-816.
11. Sirota, N.N., Olekhnovich, N.M., and Olekhnovich, A.I., A Vacuum Chamber for X-ray Diffraction Studies over a Wide Temperature Range, in Khimicheskaya svyaz' v poluprovodnikakh (Chemical Bonding in Semiconductors), Minsk: Nauka i Tekhnika, 1969, pp. 172-174.
12. 2, Izv. Akad. Nauk SSSR, Neorg. Mater., 1985, vol. 21, no. 7, pp. 1110-1113.
13. Mirkin, L.I., Spravochnik po rentgenostrukturnomu analizu (Handbook of X-ray Diffraction), Moscow: Fizmatgiz, 1961.
14. 5 Type Chalcopyrite, J. Chem. Phys., 1973, vol. 9, no. 10, pp. 5415-5422.
15. Nye, J.D., Physical Properties of Crystals, New York: Oxford Univ. Press, 1957. Translated under the title Fizicheskie svoistva kristallov, Moscow: Inostrannaya Literatura, 1960.
16. Nye, J.D., Physical Properties of Crystals, New York: Oxford Univ. Press, 1957. Translated under the title Fizicheskie svoistva kristallov, Moscow: Inostrannaya Literatura, 1960.
17. Novikova, S.I., Teplovoe rasshirenie tverdykh tel (Thermal Expansion of Solids), Moscow: Nauka, 1974.
18. Novikova, S.I., Anisotropy Parameter of Thermal Expansion, Izmer. Tekh., 1985, no. 1, pp. 48-50.
19. 2 Compounds, Phys. Status. Solidi A, 1981, vol. 66, no. 2, pp. 597-600.
20. Kistaich, P., Venudhar, Y.C., Murthy, K.S., et al., Temperature Dependence of Tetragonal Distortion and Thermal Expansion of Copper Indium Selenide, J. Phys. D: Appl. Phys., 1981, vol. 14, no. 7, pp. 1311-1316.
21. 2 Chalcopyrite Semiconductors, J. Less-Common Met., 1985, vol. 105, no. 1, pp. 37-54.