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Volumn 361, Issue , 2000, Pages 56-60
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Investigation of thin films of the Cu-In and CuInS2 system
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
COPPER COMPOUNDS;
CRYSTAL MICROSTRUCTURE;
EVAPORATION;
HYDROGEN;
HYDROGEN SULFIDE;
MORPHOLOGY;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING GLASS;
SUBSTRATES;
X RAY DIFFRACTION ANALYSIS;
REACTIVE ANNEALING;
SEMICONDUCTING FILMS;
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EID: 0033896136
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(99)00834-2 Document Type: Article |
Times cited : (29)
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References (11)
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