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Volumn 361, Issue , 2000, Pages 56-60

Investigation of thin films of the Cu-In and CuInS2 system

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COPPER COMPOUNDS; CRYSTAL MICROSTRUCTURE; EVAPORATION; HYDROGEN; HYDROGEN SULFIDE; MORPHOLOGY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GLASS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

EID: 0033896136     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00834-2     Document Type: Article
Times cited : (29)

References (11)
  • 1
    • 85031588864 scopus 로고    scopus 로고
    • 2nd World Conf. on Photovoltaic Solar Energy Conversion, Vienna, 6-10 July (European Commission, Directorate General Joint Research Centre, Environment Institute, Renewable Energies Unit, 1-21020 Ispra (VA) - Italy, 1999)
    • 2nd World Conf. on Photovoltaic Solar Energy Conversion, Proc. Int. Conf., Vienna, 6-10 July 1998 (European Commission, Directorate General Joint Research Centre, Environment Institute, Renewable Energies Unit, 1-21020 Ispra (VA) - Italy, 1999).
    • (1998) Proc. Int. Conf.
  • 6
    • 0005279968 scopus 로고    scopus 로고
    • Rich. Seifert & Co., GmbH & Co. KG, Röntgenwerk, Bogenstrasse 41, D-22926 Ahrensburg, Germany
    • T. Taut, J. Bergmann, Rietveld Analysis Program BGMN, 2nd Edition, Rich. Seifert & Co., GmbH & Co. KG, Röntgenwerk, Bogenstrasse 41, D-22926 Ahrensburg, Germany, 1998.
    • (1998) Rietveld Analysis Program BGMN, 2nd Edition
    • Taut, T.1    Bergmann, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.