Synchrotron X-ray diffraction evidence for native defects in the photovoltaic semiconductor CuInSe2

Advanced Materials

Volumn 12, Issue 5, 2000, Pages 366-370

  Kaplan, Larissa ^a   Leitus, Gregory ^a   Lyakhovitskaya, Vera ^a   Frolow, Felix ^b   Hallak, Hanna ^d   Kvick, Åke ^c   Cahen, David ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

^b TEL AVIV UNIVERSITY   (Israel)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d NONE

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; COPPER COMPOUNDS; DEPOSITION; ELECTROMIGRATION; PHOTOTRANSISTORS; PHOTOVOLTAIC CELLS; SINGLE CRYSTALS; SOLAR CELLS; SYNCHROTRON RADIATION; X RAY DIFFRACTION ANALYSIS;

COPPER INDIUM DISELENIDE; GLANCING ANGLE DEPOSITION (GLAD);

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 0033888588     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-4095(200003)12:5<366::AID-ADMA366>3.0.CO;2-9     Document Type: Article

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