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1
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85076762319
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A prototype laser activated bimetallic thermal resist for microfabrication
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January
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M. V. Sarunic, G. H. Chapman, Y. Tu, "A Prototype Laser Activated Bimetallic Thermal Resist For Microfabrication", Proc. SPIE Vol. 4274, pp 183-193, January, 2001.
-
(2001)
Proc. SPIE
, vol.4274
, pp. 183-193
-
-
Sarunic, M.V.1
Chapman, G.H.2
Tu, Y.3
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2
-
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0034765777
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BiIn: A sensitive bimetallic thermal resist
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G. H. Chapman, Y. Tu, M. V. Sarunic, "BiIn: a Sensitive Bimetallic Thermal Resist", Proc. SPIE Vol. 4345, pp. 557-568, 2001.
-
(2001)
Proc. SPIE
, vol.4345
, pp. 557-568
-
-
Chapman, G.H.1
Tu, Y.2
Sarunic, M.V.3
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3
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0036030909
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Bi/In bimetallic thermal resists for microfabrication, photomasks and micromachining applications
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San Josa, CA, Mar.
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G. H. Chapman, Y. Tu, and M. V. Sarunic "Bi/In Bimetallic Thermal Resists for Microfabrication, Photomasks and Micromachining Applications", Proc. SPIE Vol. 4690, pp 465-476, San Josa, CA, Mar., 2002.
-
(2002)
Proc. SPIE
, vol.4690
, pp. 465-476
-
-
Chapman, G.H.1
Tu, Y.2
Sarunic, M.V.3
-
4
-
-
0036403668
-
Bimetallic thermally activated films for microfabrication, photomasks and data storage
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Y. Tu, G.H. Chapman, and M.V. Sarunic. "Bimetallic Thermally Activated Films for Microfabrication, Photomasks and Data Storage", Proc. SPIE Vol. 4637, pp 330-340, 2002.
-
(2002)
Proc. SPIE
, vol.4637
, pp. 330-340
-
-
Tu, Y.1
Chapman, G.H.2
Sarunic, M.V.3
-
5
-
-
4243523301
-
Method for making thermochromic photomasks
-
United States Patent No. 4,225,659, September 30
-
Jerome Drexler, "Method for making thermochromic photomasks", United States Patent No. 4,225,659, September 30, 1980.
-
(1980)
-
-
Drexler, J.1
-
6
-
-
5244353674
-
Attenuated phase-shifting mask with a single-layer absorptive shifter of CrO, CrON, MoSiO and MoSiON film
-
Masayuki Nakajima, et al, "Attenuated phase-shifting mask with a single-layer absorptive shifter of CrO, CrON, MoSiO and MoSiON film," Proc. SPIE Vol. 2197, pp 111-121, 1994.
-
(1994)
Proc. SPIE
, vol.2197
, pp. 111-121
-
-
Nakajima, M.1
-
7
-
-
0028736125
-
Attenuated phase-shifting photomasks fabricated from Cr-based embedded shifter blanks
-
F. D. Kalk, R. H. French, H. U. Alpay, G. Hughes, "Attenuated Phase-Shifting Photomasks Fabricated from Cr-Based Embedded Shifter Blanks", Proc. SPIE Vol. 2254, pp 64-70, 1994.
-
(1994)
Proc. SPIE
, vol.2254
, pp. 64-70
-
-
Kalk, F.D.1
French, R.H.2
Alpay, H.U.3
Hughes, G.4
-
8
-
-
0141730852
-
Manufacture of photomask
-
Japan Patent No. 55-143560, Aug.11
-
Yamazaki Teruhiko, et al, "Manufacture of photomask", Japan Patent No. 55-143560, Aug.11, 1980.
-
(1980)
-
-
Teruhiko, Y.1
-
9
-
-
0141730851
-
Manufacture of photomask
-
Japan Patent No. 55-144245, Nov. 11
-
Kato Tadao, et al, "Manufacture of photomask", Japan Patent No. 55-144245, Nov. 11, 1980.
-
(1980)
-
-
Tadao, K.1
-
10
-
-
0141507521
-
Photomask structure
-
United States Patent No. 6,440,617, August
-
Erwin Deng, Sylvia Hwang, "Photomask Structure", United States Patent No. 6,440,617, August, 2002
-
(2002)
-
-
Deng, E.1
Hwang, S.2
-
11
-
-
0141507519
-
Halftone phase shift photomask comprising a single layer of halftone light blocking and phase shifting
-
United States Patent No. 5,604,060, February 18
-
Hiroyuki Miyashita, et al., "Halftone phase shift photomask comprising a single layer of halftone light blocking and phase shifting", United States Patent No. 5,604,060, February 18, 1997.
-
(1997)
-
-
Miyashita, H.1
-
12
-
-
0004245602
-
International technology roadmap of semiconductor 2001, Lithography
-
International SEMATECH
-
"International Technology Roadmap of Semiconductor 2001, Lithography", International SEMATECH, 2001.
-
(2001)
-
-
-
13
-
-
0007088118
-
Process technology for next generation photomask
-
Jung-Min Sohn, et al, "Process Technology for Next Generation Photomask", Jpn. J. Appl. Phys. Vol. 37, Pt. 1, No. 12B pp 6669-6674, 1998.
-
(1998)
Jpn. J. Appl. Phys.
, vol.37
, Issue.12 PART 1 B
, pp. 6669-6674
-
-
Sohn, J.-M.1
-
14
-
-
0013365911
-
The photomask industry: Minimizing a crisis in escalating costs
-
Aug
-
Robert N. Castellano, "The photomask industry: minimizing a crisis in escalating costs", Solid State Technology, pp 44-48, Aug 2002
-
(2002)
Solid State Technology
, pp. 44-48
-
-
Castellano, R.N.1
-
15
-
-
0141507520
-
Photomask material, photomask and methods for the production thereof
-
Unite State Patent No. 6,303,262, October 16
-
Kazuchiyo Takaoka, et al, "Photomask material, photomask and methods for the production thereof", Unite State Patent No. 6,303,262, October 16, 2001
-
(2001)
-
-
Takaoka, K.1
-
16
-
-
0005094659
-
Dry multilayer inorganic alloy thermal resist for lithographic processing and image creation
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PCT patent application WO 02/06897 A2, applied for Jan 24
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G. H. Chapman, M. V. Sarunic, Y. Tu, "Dry Multilayer Inorganic Alloy Thermal Resist for Lithographic Processing and Image Creation", PCT patent application WO 02/06897 A2, applied for Jan 24, 2002.
-
(2002)
-
-
Chapman, G.H.1
Sarunic, M.V.2
Tu, Y.3
-
17
-
-
0003720630
-
Constitution of binary alloys
-
McGraw-Hill
-
Max Hansen, Constitution of binary alloys, McGraw-Hill, 1958.
-
(1958)
-
-
Hansen, M.1
-
18
-
-
1842599550
-
Wavelength-invariant resist composed of bimetallic layers
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Y. Tu, M. Karimi, N. Morawej, W. N. Lennard1, T. W. Simpson1, J. Peng, K. L. Kavanagh, and G. H. Chapman, "Wavelength-Invariant Resist Composed of Bimetallic Layers", accepted by MRS Fall Meeting, Boston, 2002.
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MRS Fall Meeting, Boston, 2002
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Tu, Y.1
Karimi, M.2
Morawej, N.3
Lennard, W.N.4
Simpson, T.W.5
Peng, J.6
Kavanagh, K.L.7
Chapman, G.H.8
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