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Volumn 4690 I, Issue , 2002, Pages 465-476

Bi/In bimetallic thermal resists for microfabrication, photomasks and micromachining applications

Author keywords

Inorganic photoresist; Microlithography; Thermal Resist

Indexed keywords

BISMUTH COMPOUNDS; ELECTROPLATING; MASKS; MICROMACHINING; NITRIC ACID; SILICON WAFERS; SUBSTRATES; THIN FILMS;

EID: 0036030909     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.474201     Document Type: Conference Paper
Times cited : (13)

References (12)
  • 1
    • 85076762319 scopus 로고    scopus 로고
    • A prototype laser activated bimetallic thermal resist for microfabrication
    • January
    • M.V. Sarunic, G.H. Chapman, Y. Tu, "A Prototype Laser Activated Bimetallic Thermal Resist For Microfabrication", Proc. SPIE Vol. 4274, pp. 183-193, January 2001.
    • (2001) Proc. SPIE , vol.4274 , pp. 183-193
    • Sarunic, M.V.1    Chapman, G.H.2    Tu, Y.3
  • 7
    • 5544273104 scopus 로고
    • Plasma-deposited amorphous carbon films as planarization layers
    • Nov./Dec.
    • S.W. Pang and M.W. Horn, "Plasma-deposited amorphous carbon films as planarization layers", J. Vac. Sci. Technol. B, Vol. 8, No. 6, Nov/Dec 1990.
    • (1990) J. Vac. Sci. Technol. B , vol.8 , Issue.6
    • Pang, S.W.1    Horn, M.W.2
  • 10
    • 0032663132 scopus 로고    scopus 로고
    • UV thermoresists: Sub-100-nm imaging without proximity effects
    • March
    • D. Gelbart and V.A. Karasyuk, "UV thermoresists: sub-100-nm imaging without proximity effects", Proc. SPIE Vol. 3676, p. 786-793, March 1999.
    • (1999) Proc. SPIE , vol.3676 , pp. 786-793
    • Gelbart, D.1    Karasyuk, V.A.2
  • 11
    • 0000129857 scopus 로고    scopus 로고
    • Diffusion barrier properties of single- and multilayered quasi-amorphous tantalum nitride thin films against copper penetration
    • G.S. Chen, S.T. Chen, "Diffusion Barrier Properties of Single- and Multilayered Quasi-amorphous Tantalum Nitride Thin Films against Copper Penetration", J. Appl. Phys. 87, 8473 (2000).
    • (2000) J. Appl. Phys. , vol.87 , pp. 8473
    • Chen, G.S.1    Chen, S.T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.