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Volumn 42, Issue 9 A, 2003, Pages 5465-5471

Photoreflectance spectroscopy of ZnO for ordinary and extraordinary rays

Author keywords

Critical point; Fundamental absorption edge; Photoreflectance; Temperature dependence; ZnO

Indexed keywords

BINDING ENERGY; ENERGY GAP; EXCITONS; LIGHT POLARIZATION; REFLECTION; SEMICONDUCTOR DEVICE STRUCTURES; SINGLE CRYSTALS; SPECTROSCOPY; TEMPERATURE; THREE DIMENSIONAL; ZINC OXIDE;

EID: 0344925611     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.5465     Document Type: Article
Times cited : (28)

References (50)
  • 28
    • 0000425719 scopus 로고
    • ed. M. Balkanski (North-Holland, Amsterdam)
    • F. H. Pollak: Handbook on Semiconductors, ed. M. Balkanski (North-Holland, Amsterdam, 1994) Vol. 2, p. 527.
    • (1994) Handbook on Semiconductors , vol.2 , pp. 527
    • Pollak, F.H.1
  • 45


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.