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Volumn 347, Issue 1-2, 1999, Pages 133-145

Columnar growth structure and evolution of wavy interface morphology in amorphous and polycrystalline multilayered thin films

(2) Czigany Zs a Radnoczi G a

a RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; DEPOSITION; FILM GROWTH; GRAIN BOUNDARIES; IMPURITIES; INTERFACES (MATERIALS); MORPHOLOGY; MULTILAYERS; POLYCRYSTALLINE MATERIALS; TRANSMISSION ELECTRON MICROSCOPY; WAVES;

COLUMN WALLS; COLUMNAR GROWTH; INTERFACE MINIMA; INTERFACE WAVES; LAYER THICKNESS; STRUCTURAL PROPERTIES; WAVY INTERFACE MORPHOLOGY;

THIN FILMS;

EID: 0344771137 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(98)01760-X Document Type: Article

Times cited : (43)

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