Evolution of grain structure in thin film reactions

Journal of Electronic Materials

Volumn 26, Issue 9, 1997, Pages 1009-1020

  Barmak, K ^a   Rickman, J M ^a   Michaelsen, C ^b  

^a Lehigh University   (United States)

^b INSTITUTE OF MATERIALS RESEARCH   (Germany)

Author keywords

Grain structure; Microstructure; Niobium aluminum; Polycrystalline; Thin film reactions; Thin films; Titanium aluminum

Indexed keywords

EID: 0004462181     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-997-0238-x     Document Type: Article

References (25)

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2. C. Michaelsen, G. Lucadamo and K. Barmak, J. Appl. Phys. 80, 6689 (1996) and references therein.
3. K. Barmak, C. Michaelsen and G. Lucadamo, J. Mater. Res. 12, 133 (1997) and references therein.
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