Delay defect diagnosis based upon a statistical timing model - The first step

IEE Proceedings: Computers and Digital Techniques

Volumn 150, Issue 5 SPEC. ISS., 2003, Pages 346-354

  Krstic, A ^a   Wang, L C ^a   Cheng, K T ^a   Liou, J J ^b   Abadir, M S ^c  

^a University of California   (United States)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^c MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DELAY DEFECTS; LOGIC DEFECTS; STATISTICAL TIMING MODELS;

ALGORITHMS; COMPUTATIONAL METHODS; COMPUTER SIMULATION; ERROR ANALYSIS; FAULT TOLERANT COMPUTER SYSTEMS; HEURISTIC METHODS; LOGIC CIRCUITS; PROBABILITY; STATISTICAL METHODS;

DELAY CONTROL SYSTEMS;

EID: 0344496063     PISSN: 13502387     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-cdt:20030834     Document Type: Conference Paper

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