메뉴 건너뛰기




Volumn 47, Issue 10, 1998, Pages 1124-1135

Location of stuck-at faults and bridging faults based on circuit partitioning

Author keywords

Circuit partitioning; Fault diagnosis

Indexed keywords

COMBINATORIAL CIRCUITS; COMPUTER SIMULATION; MICROPROCESSOR CHIPS; SEQUENTIAL CIRCUITS;

EID: 0032181414     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.729795     Document Type: Article
Times cited : (13)

References (29)
  • 1
    • 33747061518 scopus 로고
    • Test and Diagnosis Procedure for Digital Networks
    • Jan.
    • E.J. McCluskey, "Test and Diagnosis Procedure for Digital Networks," Computer, pp. 17-20, Jan. 1971.
    • (1971) Computer , pp. 17-20
    • McCluskey, E.J.1
  • 3
    • 84990633161 scopus 로고
    • Fault Diagnosis Based on Effect-Cause Analysis: An Introduction
    • June
    • M. Abramovici and M.A. Breuer, "Fault Diagnosis Based on Effect-Cause Analysis: An Introduction," Proc. 17th Design Automation Conf., pp. 69-76, June 1980.
    • (1980) Proc. 17th Design Automation Conf. , pp. 69-76
    • Abramovici, M.1    Breuer, M.A.2
  • 4
    • 0019213962 scopus 로고
    • Fault Dictionary Compression: Recognizing when a Fault May Be Unambiguously Represented by a Single Failure Detection
    • Nov.
    • R.E. Tulloss, "Fault Dictionary Compression: Recognizing when a Fault May Be Unambiguously Represented by a Single Failure Detection," Proc. 1980 Test Conf., pp. 368-370, Nov. 1980.
    • (1980) Proc. 1980 Test Conf. , pp. 368-370
    • Tulloss, R.E.1
  • 8
    • 0022875085 scopus 로고
    • Integrating Guided Probe and Fault Dictionary: An Enhanced Diagnostic Approach
    • V. Ratford and P. Keating, "Integrating Guided Probe and Fault Dictionary: An Enhanced Diagnostic Approach," Proc. Int'l Test Conf., pp. 304-311, 1986.
    • (1986) Proc. Int'l Test Conf. , pp. 304-311
    • Ratford, V.1    Keating, P.2
  • 10
    • 0024053829 scopus 로고
    • A Method of Fault Analysis for Test Generation and Fault Diagnosis
    • July
    • H. Cox and J. Rajski, "A Method of Fault Analysis for Test Generation and Fault Diagnosis," IEEE Trans. Computer-Aided Design, July 1988.
    • (1988) IEEE Trans. Computer-Aided Design
    • Cox, H.1    Rajski, J.2
  • 14
    • 0026716871 scopus 로고
    • Fault Location with Current Monitoring
    • Oct.
    • R.C. Aitken, "Fault Location with Current Monitoring," Proc. 1991 Int'l Test Conf., pp. 623-632, Oct. 1991.
    • (1991) Proc. 1991 Int'l Test Conf. , pp. 623-632
    • Aitken, R.C.1
  • 16
    • 0026618571 scopus 로고
    • Coupling Electron-Beam Probing with Knowledge-Based Fault Localization
    • Oct.
    • M. Marzouki, J. Laurent, and B. Courtois, "Coupling Electron-Beam Probing with Knowledge-Based Fault Localization," Proc. 1991 Int'l Test Conf., pp. 238-247, Oct. 1991.
    • (1991) Proc. 1991 Int'l Test Conf. , pp. 238-247
    • Marzouki, M.1    Laurent, J.2    Courtois, B.3
  • 22
    • 0025480229 scopus 로고
    • Diagnosing CMOS Bridging Faults with Stuck-At Fault Dictionaries
    • Sept.
    • S.D. Millman, E.J. McCluskey, and J.M. Acken, "Diagnosing CMOS Bridging Faults with Stuck-At Fault Dictionaries," Proc. 1990 Int'l Test Conf., pp. 860-870, Sept. 1990.
    • (1990) Proc. 1990 Int'l Test Conf. , pp. 860-870
    • Millman, S.D.1    McCluskey, E.J.2    Acken, J.M.3
  • 23
    • 0027149629 scopus 로고
    • An Algorithm for Diagnosing Two-Line Bridging Faults in Combinational Circuits
    • June
    • S. Chakravarty and Y. Gong, "An Algorithm for Diagnosing Two-Line Bridging Faults in Combinational Circuits," Proc. 1993 Design Automation Conf., pp. 520-524, June 1993.
    • (1993) Proc. 1993 Design Automation Conf. , pp. 520-524
    • Chakravarty, S.1    Gong, Y.2
  • 25
    • 0029244675 scopus 로고
    • Better Models or Better Algorithms? Techniques to Improve Fault Diagnosis
    • Feb.
    • R.C. Aitken and P.C. Maxwell, "Better Models or Better Algorithms? Techniques to Improve Fault Diagnosis," HP J., pp. 110-116, Feb. 1995.
    • (1995) HP J. , pp. 110-116
    • Aitken, R.C.1    Maxwell, P.C.2
  • 27
    • 0026989872 scopus 로고
    • Algorithms for Current Monitor Based Diagnosis of Bridging and Leakage Faults
    • June
    • S. Chakravarty and M. Liu, "Algorithms for Current Monitor Based Diagnosis of Bridging and Leakage Faults," Proc. 1992 Design Automation Conf., pp. 353-356, June 1992.
    • (1992) Proc. 1992 Design Automation Conf. , pp. 353-356
    • Chakravarty, S.1    Liu, M.2
  • 28
    • 0026618720 scopus 로고
    • COMPACTEST: A Method to Generate Compact Test Sets for Combinational Circuits
    • Oct.
    • I. Pomeranz, L.N. Reddy, and S.M. Reddy, "COMPACTEST: A Method to Generate Compact Test Sets for Combinational Circuits," Proc. 1991 Int'l Test Conf., pp. 194-203, Oct. 1991.
    • (1991) Proc. 1991 Int'l Test Conf. , pp. 194-203
    • Pomeranz, I.1    Reddy, L.N.2    Reddy, S.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.