|
Volumn 10, Issue 27, 1998, Pages
|
29Si hyperfine structure of the Pb1 interface defect in thermal (100)Si/SiO2
a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 0343439129
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/10/27/004 Document Type: Article |
Times cited : (4)
|
References (24)
|