SnO2 thin films prepared by ion beam induced CVD: preparation and characterization by X-ray absorption spectroscopy

Thin Solid Films

Volumn 353, Issue 1, 1999, Pages 113-123

  Jimenez V M ^a   Espinos J P ^a   Caballero, A ^a   Contreras, L ^a   Fernandez A ^a   Justo, A ^a   Gonzalez Elipe A R ^a  

^a UNIVERSITY OF SEVILLE   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CHEMICAL VAPOR DEPOSITION; FILM PREPARATION; ION BEAM LITHOGRAPHY; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; STOICHIOMETRY; TEMPERATURE; TIN COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY; X RAY PHOTOELECTRON SPECTROSCOPY;

EXTENDED X RAY ABSORPTION FINE STRUCTURE; OSCILLATORY ABSORPTION; TIN OXIDES; X RAY ABSORPTION NEAR EDGE STRUCTURE; X RAY ABSORPTION SPECTROSCOPY; X RAY DIAGRAMS;

THIN FILMS;

EID: 0343091340     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00392-2     Document Type: Article

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