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Volumn 116, Issue 1-2, 1999, Pages 117-127
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Structural characterization of partially amorphous SnO2 nanoparticles by factor analysis of XAS and FT-IR spectra
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Author keywords
Factor analysis; FT IR; SnO2; Structural characterization; X ray absorption spectroscopy
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Indexed keywords
ABSORPTION SPECTROSCOPY;
COMPUTER SIMULATION;
CRYSTALLIZATION;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
INFRARED SPECTROSCOPY;
MORPHOLOGY;
NANOSTRUCTURED MATERIALS;
POWDERS;
SINTERING;
STRUCTURE (COMPOSITION);
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
FACTOR ANALYSIS;
STRUCTURAL CHARACTERIZATION;
X RAY ABSORPTION SPECTROSCOPY;
TIN COMPOUNDS;
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EID: 0032671427
PISSN: 01672738
EISSN: None
Source Type: Journal
DOI: 10.1016/s0167-2738(98)00271-9 Document Type: Article |
Times cited : (40)
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References (15)
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