Experimental observation of localized optical excitations in random metal-dielectric films

Physical Review Letters

Volumn 82, Issue 22, 1999, Pages 4520-4523

  Gresillon S ^a,b   Aigouy, L ^a,b   Boccara, A C ^a,b   Rivoal, J C ^b   Quelin, X ^c   Desmarest, C ^c   Gadenne, P ^c   Shubin, V A ^d   Sarychev, A K ^d   Shalaev, V M ^d  

^a CNRS   (France)

^b INSTITUT LANGEVIN   (France)

^c LABORATOIRE DES SCIENCES DU CLIMAT ET DE L ENVIRONNEMENT   (France)

^d NEW MEXICO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC FILMS; ELECTRIC FIELDS; ELECTRON RESONANCE; ELECTRON TRANSITIONS; MATHEMATICAL MODELS; METALLIC FILMS; OPTICAL MICROSCOPY; SCANNING; SEMICONDUCTING FILMS;

ANDERSON ELECTRON LOCALIZATION; OPTICAL EXCITATION; PLASMONS; SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM);

OPTICAL FILMS;

EID: 0038204047     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.82.4520     Document Type: Article

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