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Volumn 39, Issue SUPPL. Part 1, 2001, Pages

Spectroscopic ellipsometry study of InGaAs alloy films grown on InP

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0035542131     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (4)

References (23)
  • 16
    • 0001769056 scopus 로고
    • Modulation spectroscopy
    • edited by F. Seitz, D. Turnbell and H. Ehrenreich (Academic, New York)
    • M. Cardona, modulation Spectroscopy, Suppl. 11 of Solid state Physics, edited by F. Seitz, D. Turnbell and H. Ehrenreich (Academic, New York, 1969).
    • (1969) Solid State Physics , Issue.SUPPL. 11
    • Cardona, M.1
  • 17
    • 0001720790 scopus 로고
    • edited by M. Balkanski (North Holland, Amsterdam)
    • D. E. Aspnes, in Handbook on Semiconductors, edited by M. Balkanski (North Holland, Amsterdam, 1980), Vol. 2, p. 109.
    • (1980) Handbook on Semiconductors , vol.2 , pp. 109
    • Aspnes, D.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.