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Volumn 13, Issue 6, 2003, Pages 809-815

Modeling in-plane misalignments in lateral combdrive transducers

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTROSTATICS; FINITE ELEMENT METHOD; MICROELECTROMECHANICAL DEVICES;

EID: 0242413073     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/13/6/303     Document Type: Article
Times cited : (14)

References (15)
  • 1
  • 3
    • 0025416742 scopus 로고
    • Mechanical design issues in laterally-driven microstructures
    • Pisano A P and Cho Y-H 1990 Mechanical design issues in laterally-driven microstructures Sensors Actuators A 21-23 1060-4
    • (1990) Sensors Actuators A , vol.21-23 , pp. 1060-1064
    • Pisano, A.P.1    Cho, Y.-H.2
  • 9
    • 0242501061 scopus 로고    scopus 로고
    • An efficient numerical algorithm for extracting pull-in hyper-surfaces of electrostatic actuators with multiple uncoupled electrodes
    • San Juan
    • Elata D, Bochobza-Degani O and Nemirovsky Y 2002 An efficient numerical algorithm for extracting pull-in hyper-surfaces of electrostatic actuators with multiple uncoupled electrodes Proc. Int. Conf. on Model. and Simul. Microsyst. (San Juan) pp 206-9
    • (2002) Proc. Int. Conf. on Model. and Simul. Microsyst. , pp. 206-209
    • Elata, D.1    Bochobza-Degani, O.2    Nemirovsky, Y.3
  • 10
    • 0036544219 scopus 로고    scopus 로고
    • Modeling the pull-in parameters of electrostatic actuators with a novel lumped two degrees of freedom pull-in model
    • Bochobza-Degani O and Nemirovsky Y 2002 Modeling the pull-in parameters of electrostatic actuators with a novel lumped two degrees of freedom pull-in model Sensors Actuators A 97-98 569-78
    • (2002) Sensors Actuators A , vol.97-98 , pp. 569-578
    • Bochobza-Degani, O.1    Nemirovsky, Y.2
  • 11
    • 0034270553 scopus 로고    scopus 로고
    • Electrostatic micromechanical actuator with extended range of travel
    • Chan E K and Dutton R W 2000 Electrostatic micromechanical actuator with extended range of travel J. Microelectromech. Syst. 9 321-8
    • (2000) J. Microelectromech. Syst. , vol.9 , pp. 321-328
    • Chan, E.K.1    Dutton, R.W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.