Thermally driven reliability issues in microelectronic systems: Status-quo and challenges

Microelectronics Reliability

Volumn 43, Issue 12, 2003, Pages 1969-1974

  Lasance, Clemens J M ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COSTS; LIGHT EMITTING DIODES; OPTIMIZATION; RELIABILITY; TELECOMMUNICATION;

MICROSYSTEMS;

MICROELECTRONICS;

EID: 0242335116     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(03)00183-5     Document Type: Article

References (18)

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