The European project PROFIT: Prediction of temperature gradients influencing the quality of electronic products

Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Volumn , Issue , 2001, Pages 120-125

  Lasance, C J M ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COST EFFECTIVENESS; OPTIMIZATION; RELIABILITY; TEMPERATURE MEASUREMENT; THERMAL EXPANSION;

TEMPERATURE GRADIENTS;

ELECTRONIC EQUIPMENT MANUFACTURE;

EID: 0035016450     PISSN: 10652221     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)