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Volumn 20, Issue 1, 1997, Pages 83-85

Thermal derating - A factor of safety or ignorance

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0013448809     PISSN: 10709886     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (7)

References (12)
  • 1
    • 33748986459 scopus 로고
    • Does the cooling of electronics increase reliability?
    • A. Dasgupta et al., "Does the cooling of electronics increase reliability?," in Proc. Thermal Stresses '95 Conf., 1995, no. 231.
    • (1995) Proc. Thermal Stresses '95 Conf. , Issue.231
    • Dasgupta, A.1
  • 2
    • 0342991947 scopus 로고
    • Reliability prediction: Is Arrhenius erroneous?
    • Aug.
    • E. B. Hakim, "Reliability prediction: Is Arrhenius erroneous?," Solid State Technol., vol. 57, Aug. 1990.
    • (1990) Solid State Technol. , vol.57
    • Hakim, E.B.1
  • 3
    • 0007905679 scopus 로고
    • Accurate temperature prediction in consumer electronics: A must but still a myth
    • S. Kakac, H. Yüncü, and K. Hijikata, Eds. Norwell, MA: Kluwer
    • C. J. M. Lasance, "Accurate temperature prediction in consumer electronics: A must but still a myth," in Cooling of Electronics Systems, S. Kakac, H. Yüncü, and K. Hijikata, Eds. Norwell, MA: Kluwer, 1993, pp. 825-858.
    • (1993) Cooling of Electronics Systems , pp. 825-858
    • Lasance, C.J.M.1
  • 4
    • 0029271008 scopus 로고
    • Characterization of functional relationship between temperature and microelectronic reliability
    • Mar.
    • P. Lall et al., "Characterization of functional relationship between temperature and microelectronic reliability," Microelectron. Reliab., vol. 35, no. 3, pp. 377-402, Mar. 1995.
    • (1995) Microelectron. Reliab. , vol.35 , Issue.3 , pp. 377-402
    • Lall, P.1
  • 6
    • 0026966054 scopus 로고
    • Are components still a major problem? A review of electronic systems and device field failure returns
    • Dec
    • M. Pecht, and V. Ramappan, "Are components still a major problem? A review of electronic systems and device field failure returns," IEEE Trans. Comp., Hybrids, Manufact. Technol., vol. 15, pp. 1060-1064, Dec, 1992.
    • (1992) IEEE Trans. Comp., Hybrids, Manufact. Technol. , vol.15 , pp. 1060-1064
    • Pecht, M.1    Ramappan, V.2
  • 7
    • 0030270306 scopus 로고    scopus 로고
    • A survey of semiconductor devices
    • Oct.
    • K. K. Ng, "A survey of semiconductor devices," IEEE Trans. Electron Devices, vol. 43, pp. 1760-1766, Oct. 1996.
    • (1996) IEEE Trans. Electron Devices , vol.43 , pp. 1760-1766
    • Ng, K.K.1
  • 8
    • 33748955658 scopus 로고
    • Electronic Parts Reliability, Section 507, JPL-D-8545
    • Jet Propulsion Laboratory, JPL Derating Guidelines, Electronic Parts Reliability, Section 507, JPL-D-8545, 1994.
    • (1994) JPL Derating Guidelines
  • 10
    • 0026123867 scopus 로고
    • Mechanical engineering issues and electronic equipment reliability: Incurred costs without compensating benefits
    • Mar.
    • C. Leonard, "Mechanical engineering issues and electronic equipment reliability: Incurred costs without compensating benefits," Trans. ASME: J. Electron. Packag., vol. 113, no. 1, pp. 1-7, Mar. 1991.
    • (1991) Trans. ASME: J. Electron. Packag. , vol.113 , Issue.1 , pp. 1-7
    • Leonard, C.1
  • 11
    • 0029776642 scopus 로고    scopus 로고
    • Issues affecting early affordable access to leading electronics technologies by the US military and government
    • M. Pecht, "Issues affecting early affordable access to leading electronics technologies by the US military and government," Circuit World, vol. 22, no. 2, pp. 7-15, 1996.
    • (1996) Circuit World , vol.22 , Issue.2 , pp. 7-15
    • Pecht, M.1
  • 12
    • 33748984737 scopus 로고    scopus 로고
    • Uprating of commercial parts for use in harsh environments
    • Nov.
    • P. McCluskey et al. "Uprating of commercial parts for use in harsh environments," CALCE EPRC Rep., Nov. 1996.
    • (1996) CALCE EPRC Rep.
    • McCluskey, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.