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Volumn 42, Issue 8, 2003, Pages 5107-5112
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Ellipsometric Simulation and Preliminary Observation of Fast Crystallization Behavior of Ge2Sb2Te5 Amorphous Thin Films at Elevated Temperature
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Author keywords
Additive reaction; Crystallization kinetics; Fast ellipsometry; Ge Sb Te; Phase change optical recording media
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Indexed keywords
COMPUTER SIMULATION;
CRYSTALLIZATION;
ELLIPSOMETRY;
GERMANIUM ALLOYS;
STOICHIOMETRY;
FAST CRYSTALLIZATION BEHAVIOR;
THIN FILMS;
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EID: 0142107402
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.42.5107 Document Type: Review |
Times cited : (4)
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References (19)
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