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Volumn 42, Issue 8, 2003, Pages 5107-5112

Ellipsometric Simulation and Preliminary Observation of Fast Crystallization Behavior of Ge2Sb2Te5 Amorphous Thin Films at Elevated Temperature

Author keywords

Additive reaction; Crystallization kinetics; Fast ellipsometry; Ge Sb Te; Phase change optical recording media

Indexed keywords

COMPUTER SIMULATION; CRYSTALLIZATION; ELLIPSOMETRY; GERMANIUM ALLOYS; STOICHIOMETRY;

EID: 0142107402     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.5107     Document Type: Review
Times cited : (4)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.