메뉴 건너뛰기




Volumn 39, Issue 13, 2000, Pages 2167-2173

Measurement of the relative optical phase between amorphous and crystalline regions of the phase-change media of optical recording

Author keywords

[No Author keywords available]

Indexed keywords

GAS LASERS; OPTICAL DISK STORAGE; PHASE TRANSITIONS; REFRACTIVE INDEX; SILICON; SUBSTRATES;

EID: 0038492860     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.39.002167     Document Type: Article
Times cited : (2)

References (9)
  • 1
    • 0031247029 scopus 로고    scopus 로고
    • Edge detection in phase-change optical data storage
    • C. Peng and M. Mansuripur, “Edge detection in phase-change optical data storage, ” Appl. Phys. Lett. 71, 2088-2090 (1997).
    • (1997) Appl. Phys. Lett. , vol.71 , pp. 2088-2090
    • Peng, C.1    Mansuripur, M.2
  • 2
    • 0038278559 scopus 로고    scopus 로고
    • Measurements and simulations of differential phase-tracking signals in optical disk data storage
    • C. Peng, W. H. Yeh, and M. Mansuripur, “Measurements and simulations of differential phase-tracking signals in optical disk data storage, ” Appl. Opt. 37, 4425-4432 (1998).
    • (1998) Appl. Opt. , vol.37 , pp. 4425-4432
    • Peng, C.1    Yeh, W.H.2    Mansuripur, M.3
  • 3
    • 0028543018 scopus 로고
    • Determination of the phase change on reflection from two-beam interference
    • J. F. Biegen, “Determination of the phase change on reflection from two-beam interference, ” Opt. Lett. 19, 1690-1692 (1994).
    • (1994) Opt. Lett. , vol.19 , pp. 1690-1692
    • Biegen, J.F.1
  • 4
    • 84975655838 scopus 로고
    • Phase measurements using the Mirau correlation microscope
    • S. S. C. Chim and G. S. Kino, “Phase measurements using the Mirau correlation microscope, ” Appl. Opt. 30, 2197-2201 (1991).
    • (1991) Appl. Opt. , vol.30 , pp. 2197-2201
    • Chim, S.S.C.1    Kino, G.S.2
  • 6
    • 0000399243 scopus 로고    scopus 로고
    • Effects of phase changes on reflection and their wavelength dependence in optical pro-filometry
    • T. Doi, K. Toyoda, and Y. Tanimura, “Effects of phase changes on reflection and their wavelength dependence in optical pro-filometry, ” Appl. Opt. 36, 7157-7161 (1997).
    • (1997) Appl. Opt. , vol.36 , pp. 7157-7161
    • Doi, T.1    Toyoda, K.2    Tanimura, Y.3
  • 7
    • 77956978378 scopus 로고
    • Phase-measurement interferometry techniques
    • Wolf, ed. (Elsevier, New York
    • K. Creath, “Phase-measurement interferometry techniques, ” in Progress in Optics, E. Wolf, ed. (Elsevier, New York, 1988), Vol. 26, pp. 349-393.
    • (1988) Progress in Optics , vol.26 , pp. 349-393
    • Creath, K.1
  • 8
    • 0005259253 scopus 로고
    • Precise method for measuring the absolute phase change on reflection
    • J. M. Bennett, “Precise method for measuring the absolute phase change on reflection, ” J. Opt. Soc. Am. 54, 612-624 (1964).
    • (1964) J. Opt. Soc. Am. , vol.54 , pp. 612-624
    • Bennett, J.M.1
  • 9
    • 0000520740 scopus 로고
    • Analysis of multilayer thin-film structures containing magneto-optic and anisotropic media at oblique incidence using 2x2 matrices
    • M. Mansuripur, “Analysis of multilayer thin-film structures containing magneto-optic and anisotropic media at oblique incidence using 2x2 matrices, ” J. Appl. Phys. 67, 6466-6475 (1990).
    • (1990) J. Appl. Phys. , vol.67 , pp. 6466-6475
    • Mansuripur, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.