In-situ identification of material property values for phase-change optical recording

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3864, Issue , 1999, Pages 220-222

  Hurst, Terril ^a   Khulbe, Pramod ^a  

^a HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHIZATION; COMPUTER SIMULATION; CRYSTALLIZATION; FINITE ELEMENT METHOD; MATHEMATICAL MODELS; MELTING; PARAMETER ESTIMATION;

OPTICAL PHASE DIFFERENCE; SOFTWARE PACKAGE DIFFRACT;

OPTICAL RECORDING;

EID: 0033350704     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)