AC scan path selection for physical debugging

IEEE Design and Test of Computers

Volumn 20, Issue 5, 2003, Pages 34-40

  Crouch, Alfred L ^a   Potter, John C ^a   Doege, Jason ^a  

^a Inovys Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOOLEAN FUNCTIONS; COMPUTER DEBUGGING; DESIGN FOR TESTABILITY; TIME SERIES ANALYSIS; VECTOR QUANTIZATION;

AUTOMATIC TEST PATTERN GENERATOR; BOOLEAN TRUE PATH; DELAY FAULT MODELS; STATIC TIMING ANALYSIS;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 0142103281     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2003.1232254     Document Type: Article

References (12)

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