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Volumn 111, Issue 1297, 2003, Pages 617-623

Development and Applications of the Pioneering Technology of Structure Refinement from Powder Diffraction Data

Author keywords

Disordered structure; Maximum entropy method; MEM based pattern fitting; Partial profile relaxation; Powder diffraction; Rietveld method

Indexed keywords

AMORPHOUS MATERIALS; ANISOTROPY; CRYSTALLINE MATERIALS; ENTROPY; LIGHT REFLECTION; NEUTRON DIFFRACTION; X RAY POWDER DIFFRACTION;

EID: 0142023774     PISSN: 09145400     EISSN: None     Source Type: Journal    
DOI: 10.2109/jcersj.111.617     Document Type: Review
Times cited : (10)

References (32)
  • 5
    • 85039622668 scopus 로고
    • Ed. by Young, R. A., Oxford Univ. Press, Oxford Chap. 13
    • Izumi, F., "The Rietveld Method," Ed. by Young, R. A., Oxford Univ. Press, Oxford (1995) Chap. 13.
    • (1995) The Rietveld Method
    • Izumi, F.1
  • 14
    • 0003102401 scopus 로고    scopus 로고
    • Izumi, F., Rigaku J., Vol. 17, No. 1, pp. 34-45 (2000).
    • (2000) Rigaku J. , vol.17 , Issue.1 , pp. 34-45
    • Izumi, F.1
  • 31


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.